Systems and methods of phase diversity wavefront sensing

ABSTRACT

A phase diversity wavefront sensor includes an optical system including at least one optical element for receiving a light beam; a diffractive optical element having a diffractive pattern defining a filter function, the diffractive optical element being arranged to produce, in conjunction with the optical system, images from the light beam associated with at least two diffraction orders; and a detector for detecting the images and outputting image data corresponding to the detected images. In one embodiment, the optical system, diffractive optical element, and detector are arranged to provide telecentric, pupil plane images of the light beam. A processor receives the image data from the detector, and executes a Gerchberg-Saxton phase retrieval algorithm to measure the wavefront of the light beam.

CROSS-REFERENCES TO RELATED APPLICATIONS

This application is a divisional application of U.S. patent applicationSer. No. 12/259,381 entitled “Systems and Methods of Phase DiversityWavefront Sensing”, filed Oct. 28, 2008, which claims the prioritybenefit under 35 U.S.C. §119(e) from U.S. provisional patent application60/983,380 filed on 30 Oct. 2007, U.S. provisional patent application61/028,877 filed on 14 Feb. 2008, and U.S. provisional patentapplication 61/048,042 filed on 25 Apr. 2008, each filed in the names ofThomas D. Raymond et al., the entirety of each of which is herebyincorporated herein by reference for all purposes as if fully set forthherein.

BACKGROUND AND SUMMARY

1. Field

This invention pertains to the field of wavefront measurements, and moreparticularly to systems and methods of measuring a wavefront of lightusing a phase diversity wavefront sensor.

2. Description

A number of systems and methods have been developed for measuring awavefront of light. Such wavefront measurements have been employed in anumber of applications, including ophthalmic applications such asmeasuring aberrations of an eye, and measuring surfaces of objects suchas contact lenses.

One wavefront sensor that has been employed in a number of systems forvarious wavefront sensing applications is the Shack Hartmann wavefrontsensor (SHWS). A SHWS includes an array of lenslets which image focalspots onto a detector array. SHWS's have been employed in a variety ofophthalmic and metrological applications.

However, a SHWS has some limitations in certain applications.

For example, with a SHWS, the wavefront is expected to produce a singlelocal tilt. In general, an SHWS has difficulty measuring wavefronts withdiscontinuities. However, in some applications, and particularly in someophthalmic applications, the wavefront may have multiple tilts, whichmay produce multiple focal spots. For example, such discontinuities canbe produced by multi-focal optical devices, including multifocal contactlenses and multifocal intraocular lenses (IOL). W. Neil Charman et al.,“Can we measure wave aberration in patients with diffractive IOLs?,” 33JOURNAL OF CATARACT & REFRACTIVE SURGERY No. 11, p. 1997 (November 2007)discusses some problems in using a SHWS to make wavefront measurementsof a patient with a diffractive IOL. Charman notes that when ameasurement is taken on an eye that has been implanted with adiffractive IOL, the lenslets of the SHWS will produce multiple imagesand the detector will record multiple overlapping spot patterns. So, itis difficult at best for a SHWS to measure wavefronts produced bymultifocal optical elements, such as diffractive IOLs.

Another limitation of the SHWS pertains to its limited dynamic range.For example, to measure ophthalmic aberrations of a human eye over thewide range presented by the human population, as a practical matter oneneeds to employ an adjustable optical system in conjunction with theSHWS so that operation of the SHWS can be maintained within its dynamicrange. This can add to the complexity and cost of the measurementsystem, and requires alignment that can reduce the measurement precisionof the instrument.

Another type of wavefront sensor is a phase diversity wavefront sensor(PDWS), also sometimes referred to as a curvature sensor. A PDWS may beused to analyze wavefronts at two or more planes that are generallyorthogonal to the direction of propagation of an optical beam. Ingeneral, a PDWS measurement system makes measurements via an opticalsystem that is capable of imaging two or more planes at once, tominimize or eliminate the effects of any time-varying changes in theoptical beam. Graves et al. U.S. Pat. No. 6,439,720 describes ameasurement system that includes a PDWS. Early PDWS systems employed arelatively complex arrangement of beam splitters and/or optical delaysto generate the necessary images.

In 1999, Blanchard, P. B and Greenaway, A. H., “Simultaneous Multi-planeImaging with a Distorted Diffraction Grating,” APPLIED OPTICS (1999)(“Blanchard”) disclosed the use of a diffractive optical element (DOE)in a PDWS. As disclosed by Blanchard, the DOE uses local displacement oflines in a diffraction grating to introduce arbitrary phase shifts intowavefronts diffracted by the grating into the non-zero orders to createmultiple images of the incident light. In Blanchard's arrangement, adiffraction grating having a quadratic displacement function is employedin conjunction with a collocated single lens to alter the opticaltransfer function associated with each diffraction order such that eachorder has a different degree of defocus. Greenaway et al. U.S. Pat. No.6,975,457 and Greenaway et al. U.S. Patent Application Publication2006/0173328 describe further details of a PDWS that includes a DOE.

Otten III et al. U.S. Pat. No. 7,232,999 discloses the use of a PDWSwith a DOE for determining the characteristics of an infrared wavefrontproduced by a laser. Slimane Djidel, “High Speed, 3-Dimensional,Telecentric Imaging,” 14 OPTICS EXPRESS No. 18 (4 Sep. 2006) describesdesign, testing and operation of a system for telecentric imaging ofdynamic objects with a single lens system. However, the proceduredescribed therein is not extensible to more complicated configurations.

Nevertheless, these references are not generally directed toapplications where there is speckle and/or discontinuities or largeaberrations in the wavefront, such as may be the case in many ophthalmicapplications, including the measurement of IOLs, multifocal contactlenses, etc., and eyes or optical systems that include such devices.Furthermore, these references do not provide a generalized design methodfor incorporating a PDWS into more complicated optical systems.

It would be desirable to provide an ophthalmic measurement instrumentthat utilizes the benefits of a PDWS, alone or in conjunction with aSHWS. It would further be desirable to provide such an instrument thatcan measure wavefronts with speckle and/or discontinuities or largeaberrations in the wavefront. More particularly, it would be desirableto provide such an instrument that can perform wavefront measurementsfor systems that include a multifocal element, such as an intraocular orcontact lens that is either a refractive multifocal lens, a diffractivemultifocal lens, or a diffractive monofocal lens. It would also bedesirable to provide a generalized method of designing a measurementsystem including a PDWS.

In one aspect of the invention, a phase diversity wavefront sensorcomprises: an optical system including at least one optical element forreceiving a light beam; a diffractive optical element having adiffractive pattern defining a filter function, the diffractive opticalelement being arranged to produce, in conjunction with the opticalsystem, images from the light beam associated with at least twodiffraction orders; and a detector for detecting the images andoutputting image data corresponding to the detected images, wherein theoptical system, diffractive optical element, and detector are arrangedto provide telecentric, pupil plane images of the light beam.

In another aspect of the invention, a method is provided for measuring awavefront of an optical system including a multifocal element. Themethod comprises: providing a light beam to a lens, the lens being arefractive multifocal lens, a diffractive multifocal lens, or adiffractive monofocal lens; directing light from the lens to a phasediversity wavefront sensor, comprising an optical system including atleast one optical element for receiving a light beam, and a diffractiveoptical element the shape of which is defined by a filter function, thediffractive optical element being arranged to produce in conjunctionwith the optical system images of the light beam associated with atleast two diffraction orders; and a detector for detecting the imagesand outputting image data corresponding to the detected images; andmeasuring the wavefront of the light from the lens using the image dataoutput by the detector.

In yet another aspect of the invention, a method is provided formeasuring a wavefront of an object having first and second surfaces. Themethod comprises: providing a light beam to the object; directing lightfrom the lens to a phase diversity wavefront sensor, the lens being arefractive multifocal lens, a diffractive multifocal lens, or adiffractive monofocal lens, the phase diversity wavefront sensorcomprising an optical system including at least one optical element forreceiving a light beam, and a diffractive optical element the shape ofwhich is defined by a filter function, the diffractive optical elementbeing arranged to produce in conjunction with the optical system imagesof the light beam associated with at least two diffraction orders; and adetector for detecting the images and outputting image datacorresponding to the detected images; and simultaneously measuring thefirst and second surfaces of the object using the image data output bythe detector.

In still another aspect of the invention, a method is provided fordesigning a phase diversity wavefront sensor. The method comprises:providing one or more analytic solutions for paraxial equations thatgovern an optical configuration of the phase diversity wavefront sensor;providing a set of input design parameters for the phase diversitywavefront sensor; generating a set of output values from the analyticalsolutions and the input design parameters; and determining whether theoutput parameters meet a viability threshold.

In a further aspect of the invention, a phase diversity wavefront sensorcomprises: an illuminating optical system for delivering light onto aretina of an eye; a receiving optical system for receiving lightreflected by the retina, the receiving optical system comprising adiffractive optical element including a diffraction pattern defining afilter function, the diffractive optical element being arranged toproduce, in conjunction with the optical system, at least two imagesfrom the light beam associated with at least two diffraction orders; adetector for detecting the at least two images; a memory containinginstructions for executing a Gerchberg-Saxton phase retrieval algorithmon data produced by the detector in response to the detected images; anda processor configured to execute the Gerchberg-Saxton phase retrievalalgorithm so as to characterize a wavefront produced by the reflectedlight.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates the use of a diffractive optical element (DOE) in aphase diversity wavefront sensor (PDWS).

FIG. 2 illustrates an intensity image produced by the PDWS of FIG. 1.

FIG. 3 illustrates another configuration of a PDWS.

FIG. 4 illustrates one embodiment of diffraction grating.

FIG. 5 illustrates an intensity image produced by the PDWS of FIG. 3.

FIG. 6 illustrates operation of one embodiment of a Gerchberg-Saxton(GS) algorithm.

FIG. 7 illustrates propagation from one measurement plane to the next.

FIG. 8 illustrates the numerically calculated defocus versus iterationnumber in a GS algorithm for different pupil diameters.

FIG. 9 plots the number of iterations in a GS algorithm required toreduce the defocus error to less than 0.01 diopters versus pupildiameter.

FIG. 10 plots the number of iterations in a GS algorithm required forconvergence versus sample plane separation for a given beam diameter.

FIG. 11 illustrates the numerically calculated defocus versus iterationnumber in a GS algorithm for different pupil diameters in the case of anirradiance pattern where speckle is introduced.

FIG. 12 plots the number of iterations required to reduce the defocuserror to less than 0.01 diopters versus pupil diameter for a speckledbeam, compared to a beam without speckle.

FIGS. 13A-C illustrate basic ophthalmic aberrometer designs for SHWS andPDWS sensors.

FIG. 14 illustrates a simplified design of a PDWS with a large dynamicrange.

FIG. 15 illustrates a process of designing a measurement system thatincludes a PDWS.

FIG. 16 illustrates how the process of FIG. 15 establishes designtradeoffs by comparing design points.

FIG. 17 illustrates how a PDWS can be used to measure both surfaces of acontact lens.

FIGS. 18A-C illustrate the use of a PDWS in an ophthalmic measurementapplication.

FIG. 19 illustrates a block diagram of one embodiment of an ophthalmicaberrometer that includes a PDWS.

DETAILED DESCRIPTION

FIG. 1 illustrates the use of a diffractive optical element (DOE) in aphase diversity wavefront sensor (PDWS) 100. PDWS 100 includes anoptical element 110, a detector 120, and a processor 130. Opticalelement 110 includes a diffractive optical element (DOE) (e.g., adiffraction grating) 112 collocated with optical element 114 withpositive focal power. Although shown in transmission mode, opticalelement 110 may alternately be used in reflection where diffractiongrating 114 is collocated with optical element 114 comprising a mirror.

In the illustrated embodiment, optical element 114 is a lens, anddiffractive grating 112 is disposed on a surface of lens 114.Alternatively, diffractive grating 112 may be incorporated inside lens114 or be formed from the material used to form lens 114. In someembodiments, lens 114 and diffractive grating 112 form a single DOE,where lens 114 is itself a DOE, for example, disposed on a same surfaceor an opposite surface as diffractive grating 112. In yet otherembodiments, lens 114 and grating 112 are separate elements that touchone another or are separated by a relatively small distance. Element 114could be refractive, diffractive or reflective.

Detector 120 may be a charge coupled device (CCD).

In one embodiment, diffraction grating 112 is distorted by a quadraticfilter function so that optical element 110 introduces an optical powerthat depends upon the diffraction order. Optical element 110 producesangularly displaced beams with different focal power. The combination ofdiffraction grating 112 and lens 114 yields a net optical power givenby:

$\begin{matrix}{P = {\frac{1}{f_{TOTAL}} = {{\frac{1}{f} + \frac{R^{2}}{2m\; W_{20}}} = {P_{LENS} + P_{GRATING}}}}} & (1)\end{matrix}$where m is the diffraction order of diffraction grating 112, R=theaperture radius of diffraction grating 112 and W₂₀ is a standard defocusterm specifying the phase shift from center to edge of the optic. Thisis related to the quadratic distortion in the grating as specified byBlanchard. Note that the grating period in such distorted gratings isnot constant, but can still be specified in terms of an average periodat the DOE center. This grating period is the average distance betweenthe lines in the grating and, together with the wavelength of theincident light, determines the diffraction angle of the diffractedbeams, and hence their separation on the detector array.

In one embodiment, diffraction grating 112 is distorted by a filterfunction that is non-quadratic and has non-mixed symmetry.

In the case of illumination of DOE 110 by plane wave 10, it is clearthat each order produces a focus on either side of the detector plane.

In PDWS 100, detector 120 is located at the focal plane for the 0^(th)order beam and is referred to as an “image plane PDWS.” In that case,FIG. 2 illustrates an intensity image produced by PDWS 100. Thisarrangement produces a real image at the +1 diffraction order, a virtualimage at the −1 diffraction order, and a far field pattern at the 0diffraction pattern. As can be seen in FIG. 2, this produces a brightspot 0^(th) order beam, and dimmer spots for the +1 and −1 diffractionorders.

Data acquisition may be accomplished by two-dimensional digitization ofthe intensity image at detector 120. The image data is then supplied toprocessor 130 for further analysis to measure the wavefront of planewave 10.

FIG. 3 illustrates another configuration of a PDWS 300. PDWS 300comprises an optical element (e.g., a lens) 310, a diffractive opticalelement (e.g., a diffraction grating) 320, a camera or detector 330, anda processor 340. Detector 330 may comprise a charge coupled device(CCD). PDWS 300 possesses certain characteristics that may be beneficialfor measuring wavefronts in ophthalmic applications, as will bediscussed in greater detail below. Associated with processor 340 ismemory 345 containing instructions for executing a phase retrievalalgorithm on data produced by detector 330.

FIG. 4 illustrates one embodiment of diffraction grating 320. In oneembodiment of FIG. 4, diffraction grating 320 comprises a distortedgrating that is distorted by a quadratic filter function. This is alsoknown as an off-axis Fresnel lens.

In one embodiment, diffraction grating 320 is distorted by a filterfunction that is non-quadratic and has non-mixed symmetry.

FIG. 5 illustrates an intensity image produced by PDWS 300. In contrastto PDWS 100, which is an example of an Image Plane PDWS, PDWS 300 formsreal images of the beam at both sample planes and at the measurementplane (the Pupil Plane). Accordingly, PDWS 300 is referred to as a“Pupil Plane PDWS.”

As shown in FIG. 3, PDWS 300 forms images of the beam 350 at differentsample locations, and these images are laterally displaced at camera 330so that they can be simultaneously acquired. PDWS 300 can be thought ofas producing multiple object planes (also referred to as “observationplanes” or “sample planes’) that are imaged onto camera 330. Inparticular, object plane u⁻¹ is imaged onto the −1^(th) order beam,object plane u₀ is imaged onto the 0^(th) order beam, and object planeu₊₁, is imaged onto the +1^(th) order beam at camera.

Although FIG. 3 illustrates an example with a converging beam, acollimated beam or a diverging beam may be employed in a particularapplication. Also, although FIG. 3 illustrates three “observationplanes” it should be understood that more observation planescorresponding to additional diffraction orders can be employed and thatonly two observation planes are necessary in many applications. On theother hand, having a multitude of observation planes can provide agreater dynamic range, greater sensitivity, improved ability to discernwaves with multiple wavefronts.

Data acquisition may be accomplished by two-dimensional digitization ofthe intensity values detected by camera 330. The detected intensity datamay then be analyzed by processor 340 to determine the phasedistribution that produces the intensity measured in all planes, as willnow be explained in detail.

Knowledge of the sampled intensity profiles, the locations of the sampleplanes, and the wavelength of the beam are generally sufficient todetermine the phasefront of the beam. One phase retrieval method thathas been applied to PDWS data is to derive solutions to the IntensityTransport Equation (ITE). Phase retrieval via the ITE is fast andanalytic.

Unfortunately the application of ITE analysis to highly aberrated beamsmay be problematic. M. R. Teague, 73 JOSA No. 11, pg. 1434 (1983)derived the ITE from the wave equation expressly for the phase retrievalproblem. He showed that for a beam of intensity, I, wavefront, φ, andwave number, k=2π/1, then its transverse derivatives and its axialderivative are related by:

$\begin{matrix}{{{k\frac{\partial I}{\partial z}} = {{{{- I}{\nabla^{2}\varphi}} - {{\nabla\; I} \cdot {\nabla\varphi}}}\overset{\sim}{=}{k\;\frac{I_{- 1} - I_{1}}{z_{- 1} - z_{1}}}}}{where}} & (2) \\{{u\left( {x,y} \right)} = {\sqrt{I\left( {x,y} \right)}{{\mathbb{e}}^{{\mathbb{i}}\;{\varphi{({x,y})}}}.}}} & (3)\end{matrix}$

Since the axial derivative is not known, it is approximated by thefinite difference between the intensity measurements along thepropagation direction as shown in EQN. 2 above. This approximation failsfor beams with aberrations large enough to significantly change the beamsize between the sample planes. As such properties may be found in beamsin ophthalmic applications, the use of ITE-based phase retrieval methodsis of limited utility, for example, for a PDWS employed in an ophthalmicaberrometer.

Accordingly, to increase the phase retrieval accuracy for beams withlarge aberrations, and thereby to provide a solution for employing PDWS300 in ophthalmic applications—such as in an ophthalmic aberrometer—inPDWS 300 processor 340 performs a Gerchberg-Saxton (GB) phase retrievalalgorithm using the intensity data from camera 330. The GS method doesnot require knowledge of the axial intensity derivative, but uses allintensity measurements to numerically calculate the phase front. The GSmethod is an iterative process where known intensity measurements areused with wave propagators to estimate the intensity and phase at thenext measurement plane. Before each successive propagation step, thepredicted intensity is replaced with the measured intensity.

FIG. 6 illustrates operation of one embodiment of the GS algorithm. In afirst step, processor 340 estimates, or guesses, φ(x,y). In a next step,processor 340 takes the latest estimate of φ(x,y) and propagates it tothe next measurement plane. Then, processor 340 replaces the amplitudeof the propagated field with the square root of the intensitymeasurement at that plane. Processor 340 then propagates this data tothe next measurement plane, and the process is repeated for allmeasurement planes until the propagated intensity matches the measuredsufficiently well (e.g., the difference is less than a definedthreshold). If necessary, the process may proceed from the μ₁measurement plane, to the μ₀ measurement plane, to the μ₊₁ measurementplane, and back to the μ₀ measurement plane, then to the μ₁ measurementplane, etc., until convergence is reached.

In one embodiment processor 340 employs a Rayleigh-Sommerfeldpropagation integral to propagate from one measurement plane to thenext. FIG. 7 illustrates this propagation. Given the data μ₁(α,β) at afirst measurement plane then the data is propagated to a secondmeasurement plane, to produce propagated data μ₂(x,y) as follows:

$\begin{matrix}{{u_{2}\left( {x,y} \right)} = {\int{\int{{u_{1}\left( {\alpha,\beta} \right)}\left( \frac{z_{12}}{{\mathbb{i}}\;\lambda\; r_{12}^{2}} \right){\mathbb{e}}^{{\mathbb{i}}\;{kr}_{12}}{\mathbb{d}\alpha}{\mathbb{d}\beta}}}}} & (4)\end{matrix}$

The inventors have investigated the efficacy of the iterative GS phaseretrieval method in ophthalmic instruments where large dynamic range indefocus and the presence of speckle make phase retrieval with standardmethods based on the intensity transport equation difficult. SimulatedPDWS data covering a typical range of ophthalmic defocus aberrationswith a standard PDWS configuration were generated using theRayleigh-Sommerfeld propagation integral equation. The data wasprocessed using the GS method and the following parameters were variedto study the robustness of the method and its rate of convergence: inputpupil diameter; sample plane spacing; and irradiance characteristics.Only beams with spherical wavefronts and intensity distributions at z=0that are zero outside a circular pupil were studied. Three intensitymeasurements were used. A wavelength of 635 nm was assumed. Speckledbeams were simulated by imposing a random phase distribution withamplitude several radians on a uniform beam and propagating severalmillimeters. The size of the speckle cells of the resulting intensitydistributions averaged about 1 mm.

FIG. 8 illustrates the numerically calculated defocus versus iterationnumber for different pupil diameters. FIG. 9 plots the number ofiterations required to reduce the defocus error to less than 0.01diopters versus pupil diameter. FIGS. 8 and 9 show that convergence israpid for small diameter beams but is much slower as the beam diameterincreases. The number of iterations required to achieve a specifiedlevel of defocus accuracy increases approximately exponentially withinput pupil diameter for fixed sample spacing.

FIG. 10 plots the number of iterations required for convergence versussample plane separation for a given beam diameter. It can be seen inFIG. 10 that the convergence rate improves with sample plane separation.For a given beam size, the number of iterations required to achieve aspecified level of defocus accuracy decreases as the reciprocal of thesample plane spacing.

FIG. 11 illustrates the numerically calculated defocus versus iterationnumber for different pupil diameters in the case of an irradiancepattern where speckle is introduced. FIG. 12 plots the number ofiterations required to reduce the defocus error to less than 0.01diopters versus pupil diameter for a speckled beam (lower plot),compared to a beam without speckle (upper plot). In the case of aspeckled beam, the number of iterations required to achieve a specifiedlevel of defocus accuracy increases approximately quadratically withinput pupil diameter for fixed sample spacing, rather thanexponentially, as is the case with beams that do not include speckle.Beneficially, for beams having relatively large beam diameters (e.g.,beam diameters greater than or equal to 1.5 millimeters or greater thanor equal to 2 millimeters), this significantly reduces the number ofiterations required for beams containing large numbers of speckle cells,as is typical in ophthalmic aberrometers.

In PDWS 300, the dynamic range and sensitivity can be controlled byproper selection of the sample plane spacing and the number of bits ofdigitization of the CCD in camera 330. Meanwhile, the resolution iscontrolled by the magnification and the pitch of the pixels in camera330. Beneficially, PDWS 300 provides a wide dynamic range so as toaccommodate a wide range of aberrations in the input wavefront withoutthe need to move or adjust any optical elements, thus simplifying theconstruction of an ophthalmic measurement instrument. Beneficially, inone embodiment PDWS 300 is capable of measuring the wavefronts of beamswith at least±3 diopters of defocus. Further beneficially, in oneembodiment PDWS 300 is capable of measuring the wavefronts of beams withat least±5 diopters of defocus. Even further beneficially, in oneembodiment PDWS 300 is capable of measuring the wavefronts of beams withat least±10 diopters of defocus.

PDWS 300 includes a number of features that are desirable for anophthalmic measurement system. Pupil plane imaging provides a real imageof the pupil and accommodates variability in the location, size andshape of a human pupil when making aberrometer measurements, especiallybecause the location of a patient's eye is generally not wellcontrolled. Pupil Plane Imaging is also beneficial in resolving thephase of a speckled beam, or a wavefront having one or morediscontinuities.

Also beneficially, PDWS 300 may employ telecentric imaging. Telecentricimaging provides equally spaced sample planes, and provides equalmagnification for all images. Telecentric imaging simplifies thealignment, calibration, and data processing of PDWS 300. Further detailsof the telecentric arrangement will be provided below.

FIGS. 13A-C illustrate basic ophthalmic aberrometer designs for SHWS andPDWS sensors. Although not shown in FIGS. 13A-C, in practice theophthalmic aberrometer will include a light projection system forcreating the light beam and directing it to an eye or other object thatis being measured. For example, the wavefront u_(o) may be an image of awavefront at a pupil or corneal surface of an eye under examination.

FIG. 13A illustrates an exemplary design for an ophthalmic aberrometer1300A employing a SHWS 1310A. SHWS 1310A includes a lenslet array 1312Aand a camera, or pixel array 1314A, also called a detector array. Thedesign employs a Badal Relay Imager 1320A including two lenses 1322A and1324A. A processor 1350A processes data produced by camera 1314A.

With the SHWS 1310A, both the spatial resolution and the dynamic rangeare correlated to the dimension of the lenslets in lenslet array 1312A.The optical system typically demagnifies the pupil image to fit on SHWS1310A and the distance between lenses 1322A and 1324A is adjusted to adddefocus to compensate the incoming wavefront so that it lies within thedynamic range of SHWS 1310A. Preservation of the optical phase front isimportant with SHWS 1310A, and image quality is generally a secondaryconsideration in the optical design. The sensitivity of SHWS 1310A isset by the lenslet focal length and the pixel size in camera 1314A andis adjusted to give a predetermined sensitivity. The sensitivity andspatial resolution requirements typically limit the dynamic range ofSHWS 1301A to a few diopters. However, in aberrometer 1300A, the systemcan be dynamically adjusted to produce a larger effective dynamic rangeby moving one or both of the lenses 1322A and 1324A.

FIG. 13B illustrates an exemplary design for an ophthalmic aberrometer1300B where a PDWS 1330B replaces the SHWS 1310A of FIG. 13A. PDWS 1330Bincludes lens 1332B, diffraction grating 1333B and camera, or pixelarray 1334B, also called a detector array. A processor 1350B processesdata produced by camera 1334B.

However, the arrangement of aberrometer 1300B is unnecessarily complex.Indeed, an analysis of the paraxial equations shows that telecentricimaging conditions can be specified, but the sample plane locations ofthe±1 orders and the constrained location of diffraction grating 1333Bare all nonlinearly related to the spacing between lenses 1322B and1324B. Adjustment of Badal Relay Imager 1320B hence requires complexadjustment of the position of diffraction grating 1333B. This suggeststhat such adjustment is not necessary, and indeed, significantly itsuggests that Badal Relay Imager 1320B can be omitted.

FIG. 13C illustrates an exemplary design for an ophthalmic aberrometer1300C is tailored for PDWS 1330C. Aberrometer 1330C includes lens 1332C,diffraction grating 1333C and camera, or pixel array 1334C, also calleda detector array. A processor 1350C processes data produced by camera1334C. By taking advantage of the large native dynamic range of PDWS1330C, and the fact that it is essentially a multiplane imager, the partcount can be reduced and the moving parts found in FIGS. 13A-B can beeliminated.

Accordingly and beneficially, ophthalmic aberrometer 1300C provides acomparable dynamic range to that of 1300A, yet requires no movingelements. That is, the positional relationship between all opticalelements in ophthalmic aberrometer 1300C remains constant.

Turning again to FIG. 3, as noted above, beneficially PDWS 300 employstelecentric imaging. A generalized design procedure will now beexplained for an aberrometer including PDWS 300 so as to provide thedesired telecentric imaging.

FIG. 14 illustrates a simplified design of a PDWS with a large dynamicrange. FIG. 14 shows a first lens 1410, a second lens 1420, adiffraction grating 1430, a camera 1440, and a processor 1450. Analyticsolutions with Pupil Plane and Telecentric Imaging and the use of staticoptical elements will be explained with respect to FIG. 14.

In one embodiment, an analytic solution is performed for the paraxialequations that govern the particular optical configuration of interest,using ray matrix analysis, to determine the proper arrangement toprovide telecentric imaging. By first solving the paraxial equationsanalytically, the telecentric solution can be found by imposing theappropriate constraints on the general imaging solution; theseconstraints select the subset of the general paraxial imaging solutionswith magnification independent of grating order, or equivalently, objectpositions that depend purely linearly on grating order. In one exemplarybut non-limiting embodiment, the object plane locations for all imagesdepend linearly on the grating order and the image magnifications areindependent of the grating order for an optical configuration consistingof two lenses followed by a grating as shown in FIG. 13C. The lens focallengths are respectively f_(l) and f, the grating focal length in firstorder is f_(g), m is the grating order, s is the distance between thesecond lens and the grating, t is the distance between the lenses and vis the space between the second lens and the detector array. Equation 5shows the general solution for the telecentric pupil planeLens-Lens-Grating PDWS.

$\begin{matrix}{{s = {f - \frac{f^{2}}{f - t + f_{1}}}}{u_{m} = {\frac{\left( {{- {tv}} + {f\left( {t + v} \right)}} \right)f_{1}}{{- {tv}} + {f\left( {t + v} \right)} + {\left( {{- f} + v} \right)f_{1}}} - \frac{f^{2}{mf}_{1}^{2}}{\left( {f - t + f_{1}} \right)^{2}f_{g}}}}{{Mag} = {- \frac{v\left( {f - t + f_{1}} \right)}{{ff}_{1}}}}} & (5)\end{matrix}$

The general telecentric pupil plane imaging PDWS equations shown abovedescribe a family of solutions in which s, v and t are related for agiven set of lens and grating focal lengths. Table 1 below showsrepresentative examples of the family of analytic paraxial solutions forthe Lens-Lens-Grating configuration of FIG. 14, derived using a symbolicmanipulator (e.g., MATHEMATICA®) as shown in Equation 5, that provideboth telecentric and pupil plane imaging for static lens positions forspecific values of t and v. The sample plane locations μ_(M) (e.g., μ₁,μ₀, μ₊₁) are linear in grating order, m, and the magnification isindependent of grating order, characteristics of a telecentric imagingsystem. Note that the solution with t=f_(l) is a telecentric pupil planePDWS where the second lens and grating co-located; although this lookssimilar to the image plane sensor, the judicious positioning of eachoptical element provides the additional functionality of the pupil planePDWS.

t = f₁ t = f t = f = v s = 0$u_{m} = {{f_{1}\left( {1 - \frac{f_{1}}{f} + \frac{f_{1}}{v}} \right)} - \frac{m\; f_{1}^{2}}{f_{g}}}$${Mag} = {- \frac{v}{f_{1}}}$ $s = {f - \frac{f^{2}}{f_{1}}}$$u_{m} = {f^{2}\left( {\frac{f_{1}}{f^{2} + {\left( {{- f} + v} \right)f_{1}}} - \frac{m}{f_{g}}} \right)}$${Mag} = {1 - \frac{v}{f} - \frac{f}{f_{1}}}$$s = {f - \frac{f^{2}}{f_{1}}}$ $u_{m} = {f_{1} - \frac{f^{2}m}{f_{g}}}$${Mag} = {- \frac{f}{f_{1}}}$

FIG. 15 illustrates a process 1500 of designing a measurement systemthat includes a PDWS.

In a first step 1510, the analytical solutions are imported into aspreadsheet to explore the performance of the system versus input designparameters.

Then, in a step 1520, input design parameters are provided. The inputsmay include the optical configuration, the location of the pupil plane,the desired dynamic range.

In a step 1530, outputs are generated based on the analytical solutionsand the input design parameters. Outputs may include sensitivity, systemlength, actual dynamic range, etc.

In a step 1540, it is determined whether a viable design has beenproduced. If not, then the process returns to step 1520 and new inputparameters are provided. If a viable deign has been achieved, then adetailed analysis is performed in step 1550.

FIG. 16 illustrates how the process of FIG. 15 establishes designtradeoffs by comparing design points. FIG. 16 plots sensitivity versuspupil plane location. So, for example, if the system requires asensitivity of at least 0.01 diopters and a stand-off distance between73 and 375 mm, as illustrated in FIG. 16, an acceptable performancerange exists and final detailed ray matrix analysis of this systemconfiguration is warranted as it is a viable design. This design methodis beneficial in assisting in the early rejection of candidateconfigurations before significant investment is made in their detailedanalysis; in contrast, traditional design methods do not permit theelimination of such unviable candidate configurations without theexpense of a detailed ray matrix analysis.

FIG. 17 illustrates how a PDWS 1700, such as PDWS 300 or PDWS 1400, canbe used to measure both surfaces of a lens 17, for example, a contactlens or an intraocular lens. Light from a light source 1710 is passedthrough a beamsplitter 1720 to lens 17. Reflections are produced fromboth surfaces of lens 17 and pass back through beamsplitter to the PDWS1700 which has sample planes located about the focal positions of thelight reflected from the two lens surfaces. Here, the advantages of PDWS1700 can be seen. For example, if a SHWS were employed in thisapplication, the multiple reflections from the surfaces of lens 17 wouldgenerate multiple focal spots from its lenslet array that could confusethe processor associated with a SHWS. In contrast, PDWS 1700 can easilydistinguish between the two reflected wavefronts, and therefor bothsurfaces of lens 17 can be characterized. In this example, the wavereflected from each surface will focus at different distances from thelens; it is obvious that by suitably placing sufficient PDWS sampleplanes near these foci, sufficient data can be made available to aGerchberg-Saxton phase retrieval algorithm to determine the wavefrontfrom each surface and hence the optical effect of each surface. Morethan two sample planes may be required in such multi wavefrontapplications and their number and locations may be expected to affectthe accuracy of the phase retrieval. Generally the greater the number ofsample planes the greater the accuracy of the phase retrieval; likewise,judiciously placing the sample planes around the locations where theintensities contributed at those planes by the various wavefronts aremost disparate will lead to the greatest accuracy in retrieving eachcomponent in the multi wavefront.

FIGS. 18A-C illustrate the use of a PDWS in an ophthalmic measurementapplication. FIGS. 18A-C show ray trace results from a non-paraxialanalysis. The PDWS configuration illustrated in FIGS. 18A-C has a 300 mmpupil plane (standoff) distance, and the camera has 300 pixels across awidth of 6 mm. Other parameters include: first lens with f=100 mm and 25mm dial.; second lens with f_(l)=300 mm and 38 mm dia.; DOE withf_(g)=500 mm and 9 μm center grating period. FIG. 18A illustrates a casewhere +10 diopters of ophthalmic correction are required; FIG. 18Billustrates a case where 0 diopters of ophthalmic correction arerequired; and FIG. 18C illustrates a case where −10 diopters ofophthalmic correction are required. The ray trace analysis shown inFIGS. 18A-C shows that light rays are fully transmitted to the camera inthis arrangement for beams within the range±10 diopters of defocus; forthis reason, this configuration is suitable to acquire the datanecessary to analyze beams with this wide range of defocus. Indeed evenlarger ranges may be possible by increasing the diameter of the secondlens. The fact that the second lens is quite nearly filled by the raysin the +10 diopter case suggests that some non paraxial behavior may beexpected in this limit. The detailed ray trace analysis of such a systememploying realistic commercially available lenses shows that thenon-paraxial behavior of the system magnification departs from ideal byonly about 1.3% at the extremes of the dynamic range, well within theacceptable tolerance for an ophthalmic aberrometer.

FIG. 19 illustrates a block diagram of one embodiment of an ophthalmicaberrometer 1900 that includes a PDWS 1910, which for example can bePDWS 300 or PDWS 1400. Ophthalmic aberrometer 1900 also includes a lightsource 1920, an optical system 1930, and a processor 1950.

While preferred embodiments are disclosed herein, many variations arepossible which remain within the concept and scope of the invention.Such variations would become clear to one of ordinary skill in the artafter inspection of the specification, drawings and claims herein. Theinvention therefore is not to be restricted except within the spirit andscope of the appended claims.

We claim:
 1. A method of measuring a wavefront of an optical systemincluding a multifocal element, the method comprising: providing a lightbeam to a lens, the lens being a refractive multifocal lens, adiffractive multifocal lens, or a diffractive monofocal lens, the lensconfigured to receive a light beam having a diameter greater than about1.5 mm and comprising one or more aberrations; directing light from thelens to a phase diversity wavefront sensor, the phase diversitywavefront sensor comprising: a diffractive optical element the shape ofwhich is defined by a filter function, the diffractive optical elementbeing arranged to produce in conjunction with the optical system imagesof the light beam associated with at least two diffraction orders, theimages corresponding to at least two or more sample planes, the one ormore aberrations altering a size of the light beam between the sampleplanes; and a detector for detecting the images at a measurement planeand outputting image data corresponding to the detected images; whereinthe optical system, lens, diffractive optical element, and detector arearranged to provide telecentric, pupil plane images of the light beamsuch that real images are formed at the sample planes and themeasurement plane; and measuring the wavefront of the light from thelens using the image data output by the detector based on the imagescorresponding to the sample planes via a phase retrieval algorithm. 2.The method of claim 1, wherein the filter function is quadratic.
 3. Themethod of claim 1, wherein the filter function is non-quadratic and hasnon-mixed symmetry.
 4. The method of claim 1, wherein the diffractiveoptical element is a diffraction grating.
 5. The method of claim 1,further comprising processing the image data from the detector with aGerchberg-Saxton phase retrieval algorithm to measure the wavefront ofthe light beam.
 6. The method of claim 1, wherein the optical systemincludes a plurality of optical elements all having fixed positionalrelationships to the diffractive optical element and the detector duringthe measurement.
 7. The method of claim 1, wherein the lens is anintraocular lens (IOL) or a contact lens.
 8. The method of claim 1,wherein the lens is implanted in a human patient.
 9. A method ofmeasuring a wavefront of an object having first and second surfaces, themethod comprising: providing a light beam to the object, the objectincluding at least one optical element for receiving a light beam havinga diameter greater than about 1.5 mm and comprising one or moreaberrations, the at least one optical element having a refractivemultifocal lens, a diffractive multifocal lens, or a diffractivemonofocal lens; directing light from the object to a phase diversitywavefront sensor, the phase diversity wavefront sensor comprising: adiffractive optical element the shape of which is defined by a filterfunction, the diffractive optical element being arranged to produce inconjunction with the at least one optical element images of the lightbeam associated with at least two diffraction orders, the imagescorresponding to at least two or more sample planes, the one or moreaberrations altering a size of the light beam between the sample planes;and a detector for detecting the images and outputting image datacorresponding to the detected images; wherein the at least one opticalelement, diffractive optical element, and detector are arranged toprovide telecentric, pupil plane images of the light beam; andsimultaneously measuring the first and second surfaces of the objectusing the image data output by the detector based on the imagescorresponding to the sample planes via a phase retrieval algorithm. 10.The method of claim 9, wherein the filter function is quadratic.
 11. Themethod of claim 9, wherein the filter function is non-quadratic and hasnon-mixed symmetry.
 12. The method of claim 9, wherein the diffractiveoptical element is a diffraction grating.
 13. The method of claim 9,further comprising processing the image data from the detector with aGerchberg-Saxton phase retrieval algorithm to measure the wavefront ofthe light beam.
 14. The method of claim 9, wherein the optical systemincludes a plurality of optical elements all having fixed positionalrelationships to the diffractive optical element and the detector duringthe measurement.
 15. The method of claim 9, wherein the object is acontact lens.
 16. The method of claim 15, wherein the contact lens isimplanted in a human patient.
 17. The method of claim 9 where the objectis a human cornea and the first surface is the anterior corneal surfaceand the second surface is the posterior corneal surface.